Yokohama 2026

Three Special Days to Discover Innovative Ideas
for Solving Your Inspection Process Challenges

Schedule

December 2(Wed)-4(Fri), 2026

10:00 AM – 5:00 PM

Venue

Shintoshi Hall

Yokohama Shintoshi Building (Sogo Yokohama) 9th floor

Area Map

  • 5-minute walk from Yokohama Station
  • 20-minute walk from Pacifico Yokohama

Register to Attend Here!

Overview

CCS OpenWorld is a private trade show that provides customers with an opportunity
to explore comprehensive solutions to challenges in inspection and measurement processes.
Join us and discover the latest solutions for your inspection challenges!

Date and Venue

Date and Time

  • December 2 (Wed), 2026 | 10:00 AM – 5:00 PM (Last Admission: 4:00 PM)
  • December 3 (Thu), 2026 | 10:00 AM – 5:00 PM (Last Admission: 4:00 PM)
  • December 4 (Fri), 2026 | 10:00 AM – 5:00 PM (Last Admission: 3:00 PM)

Venue

Shintoshi Hall
Yokohama Shintoshi Building (Sogo Yokohama) 9th floor

Google Map

2-18-1, Takashima, Nishi-ku, Yokohama, Kanagawa, 220-0011, Japan

Access

  • 5-minute walk from Yokohama Station
    JR Lines (Tokaido Main Line, Yokosuka Line, Keihin-Tohoku Line, Yokohama Line)
    Keikyu Line, Tokyu Toyoko Line, Sagami Railway Line, Yokohama Municipal Subway, Minatomirai Line
  • 20-minute walk from Pacifico Yokohama

Register to Attend Here!

*Exhibit content is subject to change.
*Advance registration is required for each attendee.
*Please note that registrations from companies in the same industry may be subject to approval.

We will showcase solutions developed in collaboration with various partners
and propose cutting-edge ideas that best address your challenges.

40+ Solution Exhibits

Including New Products and Solutionss

Register to Attend Here!

Venue Map

Venue Map

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New Products and Solutions

FEATURED

New Products and Solutions

Flat Dome Light LFXV Series
Product Lineup Expansion

Flat Dome Light LFXV Series Product Lineup Expansion

Large size that achieves a wide field of view and an exceptionally thin design

We introduce the LFXV-480, a flat dome light with a 480 mm long-side light-emitting surface, offering a wider field of view than conventional models and compatibility with both area and line scan cameras.

FEATURED

New Products and Solutions

Digital Control Units PD4-A Series Product Lineup Expansion

Digital Control Units PD4-A Series Product Lineup Expansion

Addition of 2-channel and 4-channel models with lighting output of 60 W and 120 W

The PD4-A Series, designed with functions that facilitate integration into inspection systems, now includes new 2-channel and 4-channel models with lighting output of 60 W and 120 W. Equipped with sequential lighting control and functions for linking with external devices such as PLCs and cameras, the series helps reduce the effort required to build inspection environments.
*PLC: Programmable Logic Controller

New Products and Solutions

Ultra-Thin Light Integrating Coaxial And Dome Illumination
(Custom Lighting Solution Example)

Provides uniform illumination for workpieces with fine surface irregularities, such as electronic components. Its optical design supports imaging with high-resolution area cameras, making it effective for micron-level image inspection.

New Products and Solutions

Thin And Lightweight Flat Light (Custom Lighting Solution Example)

We introduce a flat light that is even thinner and lighter than the conventional LFL Series, making it suitable for the limited space available on inspection stages. (Concept exhibit)

New Products and Solutions

Coaxial Light For CIS
(Custom Lighting Solution Example)

Coaxial Light For CIS (Custom Lighting Solution Example)

We introduce a coaxial light with a thickness of 9 mm that can be used even at short working distances. Its unique lighting design achieves a highly uniform light-emitting surface and a slim optical path, enabling bright-field imaging with CIS systems that was previously difficult to achieve.
*CIS: Contact Image Sensor

New Products and Solutions

Deep Ultraviolet LED Spot Light

We present inspection examples using deep-ultraviolet wavelengths to observe transparent materials such as adhesives, resins, and glass, which are difficult to inspect with visible light.
(Concept exhibit)

New Products and Solutions

Ultra-High Output SWIR Laser Light Source

Ultra-High Output SWIR Laser Light Source

We introduce a laser SWIR light source (1370 nm) that significantly reduces speckle noise through an original optical design. It enables high-contrast image acquisition with short exposure times, helping improve inspection efficiency.
(Concept exhibit)
*SWIR: Short Wavelength InfraRed

New Products and Solutions

Lens-Integrated SWIR Lighting

Lens-Integrated SWIR Lighting

This lighting unit delivers approximately five times the brightness of a conventional imaging setup using an HLV-22IR Series spot light and a telecentric lens, enabling shorter exposure times and bright images across the entire field of view.
(Concept exhibit)
*SWIR: Short Wavelength InfraRed

New Products and Solutions

Flat Light With Vacuum Suction Function

By optimizing the air suction structure of the coaxial lighting unit, this solution achieves both uniform brightness across the light-emitting surface for visual inspection and stable suction performance across the entire surface. This inspection solution supports stable image acquisition and the movement of thin, lightweight workpieces.
(Concept exhibit)

New Products and Solutions

Logistics Inspection Solution

Logistics Inspection Solution

This logistics inspection solution combines EFFILUX's dustproof and waterproof LED lighting, designed to cover large inspection areas, with cameras featuring AI-powered machine vision and tracking capabilities.

New Products and Solutions

Interference Fringe Inspection Light For Visualizing The Presence And Non-Uniformity Of Thin Films And Coatings

Interference Fringe Inspection Light For Visualizing The Presence And Non-Uniformity Of Thin Films And Coatings

Our unique optical technology reduces the speckle noise characteristic of laser diodes, allowing the light to be used for both visual and camera-based inspection.

Image Composition Solutions

FEATURED

Image Composition Solutions

Two-Axis Phase Shift Lighting

Two-Axis Phase Shift Lighting

A vertical and horizontal stripe pattern projection system effective for observing shallow dents and sink marks

This system visualizes subtle distortions and shallow surface irregularities, such as dents, on transparent or glossy objects, contributing to highly accurate visual inspection. Its high-speed light switching also supports line scan cameras, making it suitable for a wide range of inspection environments.

Image Composition Solutions

System Example For Image Composition Inspection

We introduce a compact inspection unit that combines lighting, a camera, a lens, a standalone image processor, and related equipment to support inspection-process verification, including optical design optimization, imaging-environment evaluation, and image compositing.

Image Composition Solutions

Inspection Solution Using Photometric Stereo Method

Using the Quad Shutter Control function of Sony's IMX900 image sensor, this solution achieves ultra-high-speed imaging at 10,000 fps. It illuminates moving inspection targets from four directions and uses the photometric stereo method to enable highly accurate inspection with reduced motion blur.

High-Resolution, High-Speed Inspections

High-Resolution, High-Speed Inspections

High-Resolution Imaging Solution Using an Optical Unit

This solution achieves higher image resolution without replacing the image sensor by controlling the light incident on the camera's image sensor at the micrometer scale.

3D and Sensing

FEATURED

3D and Sensing

High-Speed 3D Measurement Using a Two-Beam Interferometric Imaging Unit

High-Speed 3D Measurement Using a Two-Beam Interferometric Imaging Unit

An Imaging Unit for Simultaneous Micrometer-Scale Height Measurement and 2D Image Acquisition

This imaging unit uses an optical design specifically developed for machine vision to simultaneously measure heights ranging from several micrometers to several millimeters and acquire images over a wider field of view than conventional microscopes. We will introduce applications that combine this unit with a high-frame-rate camera to help improve productivity.
(Concept exhibit)

3D and Sensing

Hyperspectral Imaging Inspection

Our newly developed ultra-high-output near-infrared LED light for hyperspectral cameras reduces thermal effects on inspection targets and changes in wavelength over time compared with conventional halogen light sources, providing a stable inspection environment. It is effective for classifying different materials and measuring thickness variations.

3D and Sensing

Broadband LED Spot Light

We introduce an LED spot light that emits broadband light (380–1000 nm) suitable for applications such as thin-film thickness measurement. A proprietary LED device provides spectral distribution characteristics similar to those of conventional xenon light sources.

Register to Attend Here!